Ht-instruments PVCHECK Manual de usuario descargar pdf (Pagina 22)

PVCHECK

EN - 20

5.6. DB – DATABASE MODULE MANAGEMENT

The meter allows managing up to a maximum of 30 different types of PV modules,

further to a DEFAULT module (not editable and not erasable) which can be used as

reference case when no piece of information about the type of module being tested is

available.

The parameters, referred to 1 module, which can be set are described below in Table 1

together with their measuring range, resolution and validity condition.

Symbol Description Range Resol. Conditions

Nms Number of modules per string

1  50

Pmax Maximum rated power of module

50  3200W

01.0

max





IVP

mppmpp

Voc Open-circuit voltage

15.00  99.99V

100.0  320.0V

0.01V

0.1V

Voc  Vmpp

Vmpp Voltage on maximum power point

15.00  99.99V

100.0  320.0V

0.01V

0.1V

Voc  Vmpp

Isc Short-circuit current

0.5  9.99A

0.01A

Isc  Impp

Impp Current on maximum power point

0.5  9.99A

0.01A

Isc  Impp

Toll -

Negative tolerance for Pmax provided

by the module manufacturer

0%  25.0%

0.1%

100*Tol

/Pnom< 25

0  99W

Toll +

Positive tolerance for Pmax provided

by the module manufacturer

0  25%

0.1%

100*Tol

/Pnom< 25

0  99W

Alpha Isc temperature coefficient

-0.1000.100%/°C

0.001%/°C

0.1*Alfa / Isc  0.1

-9.99  9.99mA/°C

0.01mA/°C

Beta Voc temperature coefficient

-0.99  -0.01%/°C

0.01%/°C

100*Beta/Voc  0.999

-0.999  0.001V/°C

0.001V/°C

Gamma Pmax temperature coefficient

-0.99  -0.01%/°C

0.01%/°C

NOCT Rated working temperature of cell

0  100°C

1°C

Tech. Effects due to module technology

STD (standard),

CAP (capacitive

eff.)

Rs Internal serial resistance

0.00  10.00 0.01

Table 1: Typical parameters of PV modules

CAUTION

 “Tech” is referred to the choice of the technology of the module being

tested. Select the “STD” option in case of test on “STANDARD” PV modules

or the “CAP” option in case of test on PV modules with remarkable

capacitive effects (e.g. HIT/HIP technology).



wrong choice of the type of technology can lead to a negative outcome of

the final test.

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